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Dr. Lars Hultman
Refereed Publications
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barsoumw@drexel.edu
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- Single-crystal Ti2AlN thin films, Joelsson,
T., Horling, A., Birch, J. and Hultman, L., App. Phys. Lett. 86, 111913
(2005).
pdf
- Epitaxial Ti2GeC, Ti3GeC2 and Ti4GeC3 MAX-phase
thin films grown by magnetron sputtering, Hogberg, H., Eklund, P.,
Emmerlich, J., Birch, J. and Hultman, L., J. Mater. Res., 20[4], (2005).
pdf
- Growth of Ti3SiC2 thin films
by elemental target magnetron sputtering,
Emmerlich, J., Hoegberg, H., Sasvari, S., Persson, P. O. A., Hultman, L.,
Palmquist, J.-P., Jansson, U., Molina-Aldareguia, J. M. and Czigany, Z.,
Jour. App. Phys. 96[9], 4817-4826 (2004).
pdf
- Kink formation around indents in laminated Ti3SiC2
thin films studied in the nanoscale, Molina-Aldareguia,
J. M., Emmerlich, J., Palmquist, J.-P., Jansson, U. and Hultman, L., Scripta
Mater. 49, 155-160 (2003).
pdf
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